Logic Simulation

Quality of Testing (Fault Coverage, Defect-Level)

ATPG

• Design Rule Checks (DRCs)

Fault Model

Scan Chain

BIST

Low Power Testing (Under Construction)

References

1. Verify the manufatured chips

2. Dimish system cost

   • Cost of repair goes up by an order of magnitude each step away from fab line
   1. Fab line (IC test):
      • Fab line is where the chips initially manufatured. At this stage, the defects/faults are cheapest to identify and correct because they are not packaged yet.
      • Tools like automatic test equipment (ATE) and wafer-level testing (e.g., probe card) are used here.
   2. Packaging:
      • Chips are packaged and ready for integration into a system
   3. Board-level testing:
      • Packaged chips are integrated onto circuit boards. If a defect is discovered, the entire board may have to be discard.
   4. System-level testing:
      • Boards are integrated into a system or device.
   5. In the field (End-user stage)

3. Improve system reliability (prevent errors occur)

https://www.figma.com/design/kP5fJFrKxJzpsKAo1HYPrU/Untitled?node-id=0-1&t=srQhWGj7N09IJLaM-1

• Whether B is 0 or 1, K will always be 0.

  

• Resolution:

  

• Using truth table takes huge memory to determine the output value of logic gates
• Not Efficient for multi-input logic gates

• By scanning controlling values and unknown values, efficiently determine the gate output in logic simulation

  

• $Fault\ Coverage=\frac{The\ num\ of\ Detected\ Faults} {The\ num\ of\ Total\ Faults}$
  • The fraction of faults not detected by the testing process (missed faults by the test set)
• $Defect\ Level = 1 - Y^{1-FC}$ (Brown & Williams Model)
  • It’s a model for PREDICTING the % of Test Escape
  • The probability that a defective chip remains undetected and is shipped as a "good" chip

• Use FF, so the enable must hold long enough to start pulsing the clock
• Only start pulsing the clock when SE in up

1. Digital System Testing by Prof. Sying-Jyan Wang, National Chung Hsing University (NCHU)
2. VLSI Testing by Prof. James Chien-Mo Li, National Taiwan University (NTU)